What does ATLAS mean in ARCHITECTURE


Atomic-terrace low-angle shadowing (ATLAS) is an advanced surface imaging technique used to study the topography of surfaces in detail. It can be applied to a wide variety of materials including metals, semiconductors, and biological samples. The technique combines two techniques — Low Angle Shadowing (LAS) and Electron Beam Induced Current Imaging (EBIC). By combining these two techniques, ATLAS produces very fine resolution imaging of the surface of samples which then can be used to study their properties.

ATLAS

ATLAS meaning in Architecture in Academic & Science

ATLAS mostly used in an acronym Architecture in Category Academic & Science that means Atomic-terrace low-angle shadowing

Shorthand: ATLAS,
Full Form: Atomic-terrace low-angle shadowing

For more information of "Atomic-terrace low-angle shadowing", see the section below.

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What it Does

In Low Angle Shadowing (LAS), a focused electron beam is tilted at oblique angles to the sample surface. This creates a shallow area on the sample surface, referred to as a “shadow”. As this shadow moves across the surface, it reveals atomic steps or terraces along the edge of each shadow. The electron beam also scatters secondary electrons from within this shallow region, providing contrast between different regions on the sample surface. Electron Beam Induced Current Imaging (EBIC) uses an array of detectors beneath the sample stage allowing for simultaneous imaging and spectroscopic analysis of both electrical and structural information from within each terrace. Differentially amplified signals produced by EBIC are detected allowing for determination of local electrical characteristics including charge transport and doping concentrations. By combining LAS and EBIC into one imaging system, ATLAS allows for accurate and high-resolution imaging of topographical features with additional electrical data about those features being collected simultaneously.

Essential Questions and Answers on Atomic-terrace low-angle shadowing in "SCIENCE»ARCHITECTURE"

What is Atomic-terrace Low-Angle Shadowing?

Atomic-terrace low-angle shadowing (ATLAS) is an advanced technique used to study surfaces and interfaces of materials at the nanoscale. It involves depositing a thin layer of a material onto a surface and then imaging it in order to observe the atomic level structures that make up the layers.

How is ATLAS different from other imaging techniques?

ATLAS provides detailed information on both lateral and vertical structures, whereas other imaging techniques such as scanning electron microscopy (SEM) typically only provide information on the topography of a sample. Additionally, ATLAS has much higher resolution than traditional techniques which means that it can be used to observe features that are too small for other techniques.

What materials can be studied with ATLAS?

ATLAS can be used to study a wide range of materials including metals, semiconductors, polymers, alloys and oxides.

What types of samples can be imaged using ATLAS?

The samples suitable for imaging with ATLAS must have some level of topographic complexity; this could include surfaces, buried interfaces or nanostructures such as nanoparticles or nanowires. The sample also needs to be relatively inert under electron beam irradiation in order for the images obtained to remain stable during analysis.

How does ATLAS work?

The process begins by depositing a thin layer of material onto a sample surface through physical vapor deposition (PVD). This layer is then imaged using a transmission electron microscope (TEM), which produces images with high contrast and resolution due to the reduced scattering cross section of electrons in the ultra-thin film. This allows for detailed observation of the 3D structure at nanometer resolutions even in difficult to image materials like polymers or amorphous solids.

What advantages does ATLAS offer compared to other imaging methods?

One advantage is that it offers ultra-high resolution (~1 nm) and contrast; this makes it possible to visualize details such as grain boundaries, steps on terraces and measures such as tilt angles between different layers in multilayer systems which are difficult or impossible t detect by standard SEM techniques. Additionally, since dry deposition technologies are used for sample preparation no extra post processing steps are required after data acquisition making it faster than wet etching methods often used for similar applications.

How long does an ATLAS experiment take?

Depending on the complexity of your experiment, an ATLAS experiment may take anywhere from 1 hour up to several days depending on how long data acquisition needs to take place in order to get satisfactory results. Also keep in mind that there may be additional time needed if post processing such as alignment or reconstruction need to be done after data collection has been completed.

What type of equipment do I need for an ATLAS experiment?

In order perform an ATLAS experiment you will need a transmission electron microscope equipped with dry deposition capabilities - these include physical vapor deposition (PVD) systems capable of providing thin film coatings on samples under vacuum conditions as well things like focused ion beam deposition systems capable of creating more complex patterns using ions instead of atoms/molecules from gases or liquids. An appropriate microscope stage may also need to be acquired depending on sample size since larger samples require larger stages for accurate imaging inside the micron sized chamber of TEMs.

Final Words:
ATLAS is an invaluable tool when seeking detailed information about a given material's topography on an atomic scale while concurrently gathering electrical data regarding that material's properties. This combination provides an unprecedented level of insight that was not previously attainable without multiple instruments or complex data post-processing methods. With its ability to provide such detailed analysis with greater ease than ever before, ATLAS has become a fundamental technique in many fields that require precision characterization such as materials science and semiconductor engineering.

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