What does AFM mean in MEDICAL PHYSICS

An atomic force microscope (AFM) is a type of scanning probe microscope that uses a sharp tip on the end of a cantilever to scan and map surfaces at the atomic level. AFMs are used to measure surface topography, mechanical forces, electrical properties, adhesion forces, and chemical properties of materials.

Atomic force microscopes work by scanning a sharp tip across a sample’s surface to measure features at the microscopic level. The tip is connected to a cantilever which oscillates over the sample. This allows the cantilever to detect extremely small changes in height as it moves over the sample due to interactions between its tip and the sample's surface atoms.

One advantage of using an AFM is that it can measure surface features at very fine resolutions, down to nanometer levels. Additionally, it can be used for imaging both conductive and non-conductive materials without needing additional equipment or coatings. AFMs also allow researchers to measure various material properties simultaneously such as electrical charge, friction force, adhesion force and elastic modulus.

Due to its high resolution capabilities and ability to image both conductive and non-conductive materials, AFMs are capable of studying a wide variety of samples including organic molecules, proteins, cells and biological tissue. It can also be used for studying hard materials such as metals or semiconductors as well as softer materials such polymers or ceramics.

An AFM can provide measurements related to the topography or morphology of surfaces on nanometer scales including height information by measuring changes in deflection of the cantilever as it scans across the sample’s surface. In addition, other physical parameters such as adhesion forces between different molecules or samples may also be measured using specialized techniques such as force spectroscopy or electric current mapping.

Yes, one limitation with AFMs is that they require special preparation before imaging soft and/or fragile samples since they are sensitive to mechanical forces generated by scanning operations which may damage them if not properly prepared beforehand. Additionally, some applications might achieve better results using alternative technologies such as optical microscopy which have higher spatial resolution capabilities than those found in most AFMs.

Sample preparation for imaging depends on both its composition and application being studied but generally involves ensuring good contact between your sample’s surface and the AFM tip while also optimizing scanning conditions for best results when imaging soft or delicate samples such coating them in protective layers prior operation.