What does WLBI mean in ELECTRONICS

Wafer Level Burn-In (WLBI) is a process used in the manufacturing of semiconductor devices as part of quality control and reliability assurance. It tests chips for various defects while they are still on the silicon wafer before they are sent to packaging.

By testing chipsets during the wafer stage, any defects that would otherwise be detected too late can be identified and discarded early on saving substantial production costs by avoiding to further package them into chip dies. It also helps ensure quality assurance in manufactured products since anything not up to specification can be spotted right away during WLBI testing.

Yes, it has become increasingly common among global manufacturers looking to bolster their product reliability and quality standards while cutting back on production costs associated with wasted chips.

The time it takes to perform a successful WLBI test depends on several factors including temperature range and duration; however overall it generally causes minimal impact when compared to other steps in the production process itself so total through put times typically aren't affected significantly by adding an additional step such as this one onto the manufacturing flow.

During the burn-in procedure, each chip is subjected to extreme temperatures which often times reveals defective components due to incorrect behaviors under these conditions not visible during normal operation modes. This data collected during burn-in allows technicians or automated equipment to detect errors within each chip's circuitry much easier than without having conducted these types of tests beforehand.